Price on request
View price| Manufacturer | Metricon |
|---|---|
| Model | 2010/M |
| Year | 2018 |
| Location | USA
|
| Category | Semiconductors - Metrology equipment |
| Product id | P240314068 |
| Language |
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 19/02/2026 |
The Metricon 2010/M, manufactured in 2018, is a precision metrology instrument designed for accurate measurement of refractive index and film thickness. It offers an index accuracy of ±0.0005 under typical conditions, primarily limited by uncertainties in prism angle and refractive index. When equipped with a high-resolution rotary table and calibrated per prism, the accuracy improves significantly to ±0.0001–0.0002. Index resolution is ±0.0003, which can be enhanced to ±0.00005 with the high-resolution table option.
Thickness measurements have an accuracy of ±(0.5% + 5 nm) and a resolution of ±0.3%. The instrument can measure refractive indices up to 2.65 using standard prisms, with specialized prisms available for materials with indices up to 3.35. It is capable of measuring virtually any non-metallic, non-highly absorbing film at the operating wavelength. Dual-layer films are measurable if the top film has a higher refractive index, with minimum measurable thickness depending on the film/substrate index.
The measurement area includes a contact area of approximately 8 mm² and an actual measurement spot of about 1 mm diameter. Typical measurement times range from 10 to 25 seconds with the standard rotary table and 20 to 75 seconds with the high-resolution table.
Operating wavelengths include a standard 633 nm laser diode, with optional visible wavelengths (405, 450, 473, 532, 594 nm) for thinner films and near-infrared wavelengths (830, 980, 1064, 1310, 1550 nm) for fiber and integrated optics applications. Note that optional sources increase the laser safety classification to Class IIIa or IIIb.
The equipment includes a control unit featuring an analog meter, knobs, and a green indicator light, connected via tubing to a large rectangular metal enclosure with a handle and a small flap. The unit appears clean and in good physical condition with no visible damage. A desktop computer setup is provided, including a monitor, keyboard, mouse, and a computer tower. The monitor displays the software interface showing graphical and numerical data, facilitating user operation and data analysis.
This Metricon 2010/M system is suitable for precise optical measurements in research and industrial environments requiring detailed characterization of thin films and optical materials.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
Model 2010/M Specifications
Index Accuracy: ±0.0005 (worst case), limited mainly by uncertainties in prism angle and refractive index. With a high-resolution rotary table and simple calibration per prism, accuracy improves to ±0.0001–0.0002. Calibration standards (e.g., NIST, fused silica) are available.
Index Resolution: ±0.0003 (worst case). Improves to ±0.00005 using a high-resolution table (no-cost option).
Thickness Accuracy: ±(0.5% + 5 nm)
Thickness Resolution: ±0.3%
Refractive Index Measuring Range: Up to 2.65 with standard prisms. Specialized prisms available for materials up to 3.35 (consult Metricon).
Film Types & Thickness Ranges Measurable: Can measure virtually any film that is not metallic or highly absorbing at the operating wavelength. Dual-layer films measurable if the top film has higher refractive index. Minimum measurable thickness depends on the film/substrate index.
Measurement Area: Contact area ~8 mm²; actual measurement area ~1 mm diameter.
Typical Measurement Time:
10–25 seconds with standard table
20–75 seconds with high-resolution table
Operating Wavelengths:
Standard: 633 nm
Optional visible: 405, 450, 473, 532, 594 nm (for thinner films)
Optional near-IR: 830, 980, 1064, 1310, 1550 nm (for fiber/integrated optics)
Note: Optional sources increase CDRH laser safety class to IIIa or IIIb
Laser Diodes Installed: 405 nm, 521 nm, 636 nm
Prism Code: 999.5
Computer: Dell PC with Windows 7
Manufacture Date: 10-2018
Serial Number: 23033
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
What laser diode wavelengths does this Metricon 2010/M Prism Coupler feature?
This Metricon 2010/M Prism Coupler features laser diodes with wavelengths of 405 nm, 521 nm, and 636 nm.
What type of PC is included with this equipment?
This equipment includes a Dell PC with Windows 7, manufactured in October 2018, with serial number 23033.
What is the index accuracy of this Metricon 2010/M Prism Coupler?
This Metricon 2010/M Prism Coupler has an index accuracy of ±0.0005 (worst case).
What is the absolute index accuracy of the unit?
The unit offers an absolute index accuracy of ±0.0001 to ±0.0002 with a high-resolution table and proper calibration.
What is the index resolution of this equipment?
This equipment has an index resolution of ±0.0003 (worst case), which can be improved to ±0.00005 with a high-resolution rotary table.
What is the thickness accuracy of this Metricon 2010/M Prism Coupler?
This Metricon 2010/M Prism Coupler has a thickness accuracy of ±(0.5% + 5 nm).
What is the thickness resolution of this equipment?
The thickness resolution of this equipment is ±0.3%.
What operating wavelengths can this Metricon 2010/M Prism Coupler measure?
This Metricon 2010/M Prism Coupler can measure operating wavelengths of 405, 450, 473, 532, 594 nm for thinner films and near-IR wavelengths of 830, 980, 1064, 1310, and 1550 nm for fiber/integrated optics applications.
The following questions and answers are generated using artificial intelligence based on the product information available. They are provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
Model 2010/M Specifications
Index Accuracy: ±0.0005 (worst case), limited mainly by uncertainties in prism angle and refractive index. With a high-resolution rotary table and simple calibration per prism, accuracy improves to ±0.0001–0.0002. Calibration standards (e.g., NIST, fused silica) are available.
Index Resolution: ±0.0003 (worst case). Improves to ±0.00005 using a high-resolution table (no-cost option).
Thickness Accuracy: ±(0.5% + 5 nm)
Thickness Resolution: ±0.3%
Refractive Index Measuring Range: Up to 2.65 with standard prisms. Specialized prisms available for materials up to 3.35 (consult Metricon).
Film Types & Thickness Ranges Measurable: Can measure virtually any film that is not metallic or highly absorbing at the operating wavelength. Dual-layer films measurable if the top film has higher refractive index. Minimum measurable thickness depends on the film/substrate index.
Measurement Area: Contact area ~8 mm²; actual measurement area ~1 mm diameter.
Typical Measurement Time:
10–25 seconds with standard table
20–75 seconds with high-resolution table
Operating Wavelengths:
Standard: 633 nm
Optional visible: 405, 450, 473, 532, 594 nm (for thinner films)
Optional near-IR: 830, 980, 1064, 1310, 1550 nm (for fiber/integrated optics)
Note: Optional sources increase CDRH laser safety class to IIIa or IIIb
Laser Diodes Installed: 405 nm, 521 nm, 636 nm
Prism Code: 999.5
Computer: Dell PC with Windows 7
Manufacture Date: 10-2018
Serial Number: 23033
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
What laser diode wavelengths does this Metricon 2010/M Prism Coupler feature?
This Metricon 2010/M Prism Coupler features laser diodes with wavelengths of 405 nm, 521 nm, and 636 nm.
What type of PC is included with this equipment?
This equipment includes a Dell PC with Windows 7, manufactured in October 2018, with serial number 23033.
What is the index accuracy of this Metricon 2010/M Prism Coupler?
This Metricon 2010/M Prism Coupler has an index accuracy of ±0.0005 (worst case).
What is the absolute index accuracy of the unit?
The unit offers an absolute index accuracy of ±0.0001 to ±0.0002 with a high-resolution table and proper calibration.
What is the index resolution of this equipment?
This equipment has an index resolution of ±0.0003 (worst case), which can be improved to ±0.00005 with a high-resolution rotary table.
What is the thickness accuracy of this Metricon 2010/M Prism Coupler?
This Metricon 2010/M Prism Coupler has a thickness accuracy of ±(0.5% + 5 nm).
What is the thickness resolution of this equipment?
The thickness resolution of this equipment is ±0.3%.
What operating wavelengths can this Metricon 2010/M Prism Coupler measure?
This Metricon 2010/M Prism Coupler can measure operating wavelengths of 405, 450, 473, 532, 594 nm for thinner films and near-IR wavelengths of 830, 980, 1064, 1310, and 1550 nm for fiber/integrated optics applications.
The following questions and answers are generated using artificial intelligence based on the product information available. They are provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 19/02/2026 |
The Metricon 2010/M, manufactured in 2018, is a precision metrology instrument designed for accurate measurement of refractive index and film thickness. It offers an index accuracy of ±0.0005 under typical conditions, primarily limited by uncertainties in prism angle and refractive index. When equipped with a high-resolution rotary table and calibrated per prism, the accuracy improves significantly to ±0.0001–0.0002. Index resolution is ±0.0003, which can be enhanced to ±0.00005 with the high-resolution table option.
Thickness measurements have an accuracy of ±(0.5% + 5 nm) and a resolution of ±0.3%. The instrument can measure refractive indices up to 2.65 using standard prisms, with specialized prisms available for materials with indices up to 3.35. It is capable of measuring virtually any non-metallic, non-highly absorbing film at the operating wavelength. Dual-layer films are measurable if the top film has a higher refractive index, with minimum measurable thickness depending on the film/substrate index.
The measurement area includes a contact area of approximately 8 mm² and an actual measurement spot of about 1 mm diameter. Typical measurement times range from 10 to 25 seconds with the standard rotary table and 20 to 75 seconds with the high-resolution table.
Operating wavelengths include a standard 633 nm laser diode, with optional visible wavelengths (405, 450, 473, 532, 594 nm) for thinner films and near-infrared wavelengths (830, 980, 1064, 1310, 1550 nm) for fiber and integrated optics applications. Note that optional sources increase the laser safety classification to Class IIIa or IIIb.
The equipment includes a control unit featuring an analog meter, knobs, and a green indicator light, connected via tubing to a large rectangular metal enclosure with a handle and a small flap. The unit appears clean and in good physical condition with no visible damage. A desktop computer setup is provided, including a monitor, keyboard, mouse, and a computer tower. The monitor displays the software interface showing graphical and numerical data, facilitating user operation and data analysis.
This Metricon 2010/M system is suitable for precise optical measurements in research and industrial environments requiring detailed characterization of thin films and optical materials.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |