Price on request
View price| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 17/12/2025 |
The Signatone CM100 is an ultra-stable manual probe station designed for semiconductor metrology applications, capable of accommodating wafers up to 200mm in diameter. This analytical probe station offers submicron resolution, allowing precise positioning and probing of semiconductor devices. It features manual control of both the wafer stage and the attached microscope, facilitating detailed inspection and accurate probe placement.
The wafer stage includes a rotary component with concentric circles to aid in sample placement and alignment. Two adjustable probe arms equipped with fine control knobs are mounted on the stage, enabling meticulous manipulation of probes during testing. Control knobs located on the side of the station allow for smooth stage movement.
The integrated optical microscope has dual eyepieces and is equipped with objective lenses to provide various magnification options. The microscope is connected via cable and includes a fiber optic power supply for illumination, enhancing visibility during inspection.
This unit comes with a 200mm vacuum chuck and a non-magnetic platen that requires vacuum base positioners, which are not included. The station also features coarse and fine platen lift adjustments to accommodate different sample thicknesses.
The machine is presented in clean condition with no visible damage, and power cables and a control unit are included near the device as accessories. Note that the positioners seen in some images are not part of the sale. This setup is suitable for users seeking a reliable manual prober with precise control and high-quality optical inspection capabilities.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
Signatone CM100 ultra stable 200mm manual prober with Mitutoyo microscope
Signatone CM100 manual prober sn 708151
Analytical probe station with submicron resolution
Manual control of wafer stage and microscope
200mm vacuum chuck
course and fine platen lift
Mitutoyo FS60 microscope with 5x/10x/20x/50x long working distance objectives
Fiber optic power supply for microscope illumination
Positioners in photo not included. Non-magnetic platen requires vacuum base positioners.
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
Signatone CM100 ultra stable 200mm manual prober with Mitutoyo microscope
Signatone CM100 manual prober sn 708151
Analytical probe station with submicron resolution
Manual control of wafer stage and microscope
200mm vacuum chuck
course and fine platen lift
Mitutoyo FS60 microscope with 5x/10x/20x/50x long working distance objectives
Fiber optic power supply for microscope illumination
Positioners in photo not included. Non-magnetic platen requires vacuum base positioners.
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 17/12/2025 |
The Signatone CM100 is an ultra-stable manual probe station designed for semiconductor metrology applications, capable of accommodating wafers up to 200mm in diameter. This analytical probe station offers submicron resolution, allowing precise positioning and probing of semiconductor devices. It features manual control of both the wafer stage and the attached microscope, facilitating detailed inspection and accurate probe placement.
The wafer stage includes a rotary component with concentric circles to aid in sample placement and alignment. Two adjustable probe arms equipped with fine control knobs are mounted on the stage, enabling meticulous manipulation of probes during testing. Control knobs located on the side of the station allow for smooth stage movement.
The integrated optical microscope has dual eyepieces and is equipped with objective lenses to provide various magnification options. The microscope is connected via cable and includes a fiber optic power supply for illumination, enhancing visibility during inspection.
This unit comes with a 200mm vacuum chuck and a non-magnetic platen that requires vacuum base positioners, which are not included. The station also features coarse and fine platen lift adjustments to accommodate different sample thicknesses.
The machine is presented in clean condition with no visible damage, and power cables and a control unit are included near the device as accessories. Note that the positioners seen in some images are not part of the sale. This setup is suitable for users seeking a reliable manual prober with precise control and high-quality optical inspection capabilities.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
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