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| state | good |
| At local norms | --------- |
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| Last availability date | 10/03/2026 |
The Semilab CMS3 is a non-contact emitter sheet resistance tester designed for fast and efficient material characterization and process control in photovoltaic (PV) silicon wafer production. It is specifically engineered to measure the sheet resistance of emitter layers on silicon wafers, a critical quality control parameter following emitter diffusion in PV applications.
This model belongs to the CMS series, which allows continuous measurement of wafers without stopping the conveyor belt, thereby providing high throughput suitable for in-line quality control in fully automated cell production lines. The measurement technique employed is junction photovoltage (JPV), a non-contact method ensuring minimal sample disturbance.
The CMS3 supports wafer sizes ranging from 100 mm to 156 mm, with an option for 210 mm wafers. It accommodates samples with np or pn junction structures and measures sheet resistance within a range of 10 Ω/sq to 200 Ω/sq. The probe maintains a height of approximately 1.5 mm above the transport belt, and the wafer vertical position tolerance is maintained below 400 µm. Samples are supported on a belt during measurement, and calibration is performed using wafers verified with a four-point probe method.
The equipment includes a measurement module that can accommodate 1 to 5 sheet resistance measurement heads. It is operated via an industrial PC running a Windows operating system, with peripherals included. The system offers various interface options for automation and Manufacturing Execution Systems (MES), such as 24V optically isolated I/O, Ethernet, Profibus, OPC DA, TCP/IP protocols with XML or ASCII content, SQL database support, and SECS/GEM compatibility.
From the images, the CMS3 setup is shown installed on a white table with a computer monitor mounted above, facilitating user interaction. A mechanical arm or probe assembly is part of the equipment, featuring a 'Pinch point' warning label indicating mechanical hazard areas. The front part of the equipment has a metallic base with a black and white casing. Additionally, a keyboard tray and industrial computer are visible beneath the table, supporting system operation.
Safety labels are present on the equipment, including a warning label with an exclamation mark and mechanical hazard symbols, emphasizing the need for caution during operation. This combination of features and components makes the Semilab CMS3 a robust solution for high-throughput, non-contact emitter sheet resistance testing in semiconductor manufacturing environments.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL
Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion.
The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines.
The CMS models, CMS-1A, CMS-3A, Emitter Sheet Resistance Testers allow measurement of wafers i.e. conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirement of in-line quality control in fully automated cell production lines.
Featrues and System specifications:
Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Î/sq. to 200 I/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 μm
Sample support: on belt
Calibration: by wafers verified with four point probe
Options:
Measurement module (incl. 1A-5A sheet resistance measurement heads)
Industrial PC (Windows operation system) and peripherals
CLS-1M emitter checker option
Wafer presence sensor (CMS only)
Wide variety of available interfaces to automation and MES:
24V optically isolated I/O, Ethernet interface
Profibus
OPC DA
TCP/IP protocol, content can be XML or ASCII
SQL database
SECS/GEM
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL
Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion.
The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines.
The CMS models, CMS-1A, CMS-3A, Emitter Sheet Resistance Testers allow measurement of wafers i.e. conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirement of in-line quality control in fully automated cell production lines.
Featrues and System specifications:
Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Î/sq. to 200 I/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 μm
Sample support: on belt
Calibration: by wafers verified with four point probe
Options:
Measurement module (incl. 1A-5A sheet resistance measurement heads)
Industrial PC (Windows operation system) and peripherals
CLS-1M emitter checker option
Wafer presence sensor (CMS only)
Wide variety of available interfaces to automation and MES:
24V optically isolated I/O, Ethernet interface
Profibus
OPC DA
TCP/IP protocol, content can be XML or ASCII
SQL database
SECS/GEM
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 10/03/2026 |
The Semilab CMS3 is a non-contact emitter sheet resistance tester designed for fast and efficient material characterization and process control in photovoltaic (PV) silicon wafer production. It is specifically engineered to measure the sheet resistance of emitter layers on silicon wafers, a critical quality control parameter following emitter diffusion in PV applications.
This model belongs to the CMS series, which allows continuous measurement of wafers without stopping the conveyor belt, thereby providing high throughput suitable for in-line quality control in fully automated cell production lines. The measurement technique employed is junction photovoltage (JPV), a non-contact method ensuring minimal sample disturbance.
The CMS3 supports wafer sizes ranging from 100 mm to 156 mm, with an option for 210 mm wafers. It accommodates samples with np or pn junction structures and measures sheet resistance within a range of 10 Ω/sq to 200 Ω/sq. The probe maintains a height of approximately 1.5 mm above the transport belt, and the wafer vertical position tolerance is maintained below 400 µm. Samples are supported on a belt during measurement, and calibration is performed using wafers verified with a four-point probe method.
The equipment includes a measurement module that can accommodate 1 to 5 sheet resistance measurement heads. It is operated via an industrial PC running a Windows operating system, with peripherals included. The system offers various interface options for automation and Manufacturing Execution Systems (MES), such as 24V optically isolated I/O, Ethernet, Profibus, OPC DA, TCP/IP protocols with XML or ASCII content, SQL database support, and SECS/GEM compatibility.
From the images, the CMS3 setup is shown installed on a white table with a computer monitor mounted above, facilitating user interaction. A mechanical arm or probe assembly is part of the equipment, featuring a 'Pinch point' warning label indicating mechanical hazard areas. The front part of the equipment has a metallic base with a black and white casing. Additionally, a keyboard tray and industrial computer are visible beneath the table, supporting system operation.
Safety labels are present on the equipment, including a warning label with an exclamation mark and mechanical hazard symbols, emphasizing the need for caution during operation. This combination of features and components makes the Semilab CMS3 a robust solution for high-throughput, non-contact emitter sheet resistance testing in semiconductor manufacturing environments.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
Машина за вафли Semilab CMS3
Waferovací stroj Semilab CMS3
Semilab CMS3 Wafer maskine
Semilab CMS3 Waferanlage
Μηχανή γκοφρέτας Semilab CMS3
Semilab CMS3 Sheet Resistance Measuring System
Máquina para wafer Semilab CMS3
Machine pour wafer Semilab CMS3
Stroj za oblatne Semilab CMS3
Semilab CMS3 Ostya gép
Macchina per wafer Semilab CMS3
Vaflių mašina Semilab CMS3
Semilab CMS3 Wafelmachine
Maszyna do produkcji płytek półprzewodnikowych Semilab CMS3
Máquina de wafer Semilab CMS3
Aparat pentru napolitane Semilab CMS3
Semilab CMS3 Пластина
Mašina za vafle Semilab CMS3
Semilab CMS3 Wafer maskin
Wafer Makinası Semilab CMS3
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