Price on request
View price| Software | |
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| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 10/03/2026 |
The Nanometrics Nanospec AFT2100 is a film thickness spectrometer designed for precise measurement of thin films ranging from 100 angstroms to 50 microns in thickness. This instrument has been upgraded with Olympus MS Plan infinity corrected objectives at magnifications of 5x, 10x, and 50x, which include a new vertical illuminator to enhance measurement accuracy and versatility. The spectrometer features a spot size adjustable from 6.5 microns to 65 microns, allowing for detailed analysis of small sample areas.
Operating within a wavelength range of 400 to 800 nanometers, the Nanospec AFT2100 supports 16 standard film tests. Additionally, it can measure special films by allowing the user to input the refractive index, providing flexibility for a variety of materials. The instrument includes an optical microscope with objective lenses and a stage, as well as an attached camera or sensor unit for capturing and analyzing samples.
The setup is complemented by an illumination source integrated into the microscope, which aids in sample visualization. A computer monitor and keyboard are part of the system, enabling user interaction and data display. The monitor has been observed displaying information related to common film types such as oxide on silicon, nitride on silicon, and polyimide on silicon, indicating the instrument’s application in semiconductor metrology.
This unit has been refurbished by Nanometrics factory-trained technicians as of March 2022, ensuring that it meets the manufacturer’s standards. Overall, the Nanospec AFT2100 is a comprehensive solution for accurate film thickness measurement in semiconductor and materials research environments.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
film thickness from 100A to 50 microns
Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator
spot size 6.5um to 65um
wavelength range 400-800nm
16 standard films tests
special films can be measured by entering the refractive index
Refurbished by Nanometrics factory trained technicians March 2022
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
film thickness from 100A to 50 microns
Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator
spot size 6.5um to 65um
wavelength range 400-800nm
16 standard films tests
special films can be measured by entering the refractive index
Refurbished by Nanometrics factory trained technicians March 2022
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | good |
| At local norms | --------- |
| status | |
| Last availability date | 10/03/2026 |
The Nanometrics Nanospec AFT2100 is a film thickness spectrometer designed for precise measurement of thin films ranging from 100 angstroms to 50 microns in thickness. This instrument has been upgraded with Olympus MS Plan infinity corrected objectives at magnifications of 5x, 10x, and 50x, which include a new vertical illuminator to enhance measurement accuracy and versatility. The spectrometer features a spot size adjustable from 6.5 microns to 65 microns, allowing for detailed analysis of small sample areas.
Operating within a wavelength range of 400 to 800 nanometers, the Nanospec AFT2100 supports 16 standard film tests. Additionally, it can measure special films by allowing the user to input the refractive index, providing flexibility for a variety of materials. The instrument includes an optical microscope with objective lenses and a stage, as well as an attached camera or sensor unit for capturing and analyzing samples.
The setup is complemented by an illumination source integrated into the microscope, which aids in sample visualization. A computer monitor and keyboard are part of the system, enabling user interaction and data display. The monitor has been observed displaying information related to common film types such as oxide on silicon, nitride on silicon, and polyimide on silicon, indicating the instrument’s application in semiconductor metrology.
This unit has been refurbished by Nanometrics factory-trained technicians as of March 2022, ensuring that it meets the manufacturer’s standards. Overall, the Nanospec AFT2100 is a comprehensive solution for accurate film thickness measurement in semiconductor and materials research environments.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 59 |
| Last activity | April 23, 2026 |
Система за измерване на дебелината на филма Nanometrics Nanospec AFT2100
Systém pro měření tloušťky filmu Nanometrics Nanospec AFT2100
Nanometrics Nanospec AFT2100 System til måling af filmtykkelse
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