9,050 $
Make an offer| Manufacturer | LUCEO |
|---|---|
| Model | PARALLEX |
| Year | ~ 2012 |
| Location | Malaysia
|
| Category | Semiconductors - Test and measurement equipment |
| Product id | P230406057 |
| Language |
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | in working conditions |
| At local norms | --------- |
| status | packed |
| Last availability date | 27/03/2026 |
The LUCEO PARALLEX® Platform System, manufactured in 2012, is a modular, multifunctional, multichannel bit error rate tester designed for high-speed component testing. This versatile system allows users to start with a single channel and expand to multiple channels as needed, providing flexibility through its modular architecture. It supports PRBS and user pattern generation along with error detection for data rates ranging from 2 to 13 Gbit/s.
The system configuration includes the POW4 mainframe with an integrated power supply, the GP-4 module for GPIB and USB communication, the CLK20 clock source module featuring a 20 GHz clock with divider output and multiplier function, the EPG10 pattern generator supporting 2 to 13 Gbit/s, and the EED10 error detector also operating within the 2 to 13 Gbit/s range.
Physically, the device features a metal casing with a handle on the side for portability. The front panel hosts multiple modules labeled CLK20, EED10, and EPG10, each equipped with various connectors and status indicators. Blue coaxial cables are connected to these modules, indicating readiness for signal input and output. The front panel also displays warnings regarding maximum input levels of 1.0 Vpp and 10 dBm on connectors, along with status indicators such as CLK ON, REF IN, Hold for Reset, and System Fault.
The unit appears clean and in good physical condition with no visible damage, though the casing shows some minor surface marks consistent with normal use. Branding for LUCEO Technologies and ParalleX is clearly visible on the front panel. This system is suitable for users requiring a flexible and expandable solution for high-speed bit error rate testing in semiconductor and telecommunications applications.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
Bit error rate tester
PARALLEX® Platform System
Modular Multifunctional Multichannel
Start small - grow later .... mix various functions in one frame .... single channel - multiple channel .... everything is possible with this modular approach. Already as a single channel BERT the PARALLEX® system offers full functionality for testing high speed components. PRBS and user pattern generation and error detection for 2..13Gbit/s.
Configuration:
POW4: Mainframe with power supply
GP-4: Module for GPIB/USB communication
CLK20: Clock source 20GHz with divider output and multiplier function
EPG10: Pattern generator 2-13G
EED10: Error detector 2-13G
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Client type | Factory – small or medium company |
| Active since | 2023 |
| Offers online | 11 |
| Last activity | April 15, 2026 |
Bit error rate tester
PARALLEX® Platform System
Modular Multifunctional Multichannel
Start small - grow later .... mix various functions in one frame .... single channel - multiple channel .... everything is possible with this modular approach. Already as a single channel BERT the PARALLEX® system offers full functionality for testing high speed components. PRBS and user pattern generation and error detection for 2..13Gbit/s.
Configuration:
POW4: Mainframe with power supply
GP-4: Module for GPIB/USB communication
CLK20: Clock source 20GHz with divider output and multiplier function
EPG10: Pattern generator 2-13G
EED10: Error detector 2-13G
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Software | |
| ------------------- | |
| worked hours | |
| hours under power | |
| state | in working conditions |
| At local norms | --------- |
| status | packed |
| Last availability date | 27/03/2026 |
The LUCEO PARALLEX® Platform System, manufactured in 2012, is a modular, multifunctional, multichannel bit error rate tester designed for high-speed component testing. This versatile system allows users to start with a single channel and expand to multiple channels as needed, providing flexibility through its modular architecture. It supports PRBS and user pattern generation along with error detection for data rates ranging from 2 to 13 Gbit/s.
The system configuration includes the POW4 mainframe with an integrated power supply, the GP-4 module for GPIB and USB communication, the CLK20 clock source module featuring a 20 GHz clock with divider output and multiplier function, the EPG10 pattern generator supporting 2 to 13 Gbit/s, and the EED10 error detector also operating within the 2 to 13 Gbit/s range.
Physically, the device features a metal casing with a handle on the side for portability. The front panel hosts multiple modules labeled CLK20, EED10, and EPG10, each equipped with various connectors and status indicators. Blue coaxial cables are connected to these modules, indicating readiness for signal input and output. The front panel also displays warnings regarding maximum input levels of 1.0 Vpp and 10 dBm on connectors, along with status indicators such as CLK ON, REF IN, Hold for Reset, and System Fault.
The unit appears clean and in good physical condition with no visible damage, though the casing shows some minor surface marks consistent with normal use. Branding for LUCEO Technologies and ParalleX is clearly visible on the front panel. This system is suitable for users requiring a flexible and expandable solution for high-speed bit error rate testing in semiconductor and telecommunications applications.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Factory – small or medium company |
| Active since | 2023 |
| Offers online | 11 |
| Last activity | April 15, 2026 |